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RAN Testing


EXFO’s RAN testing solution offers an integrated EPC, IMS and eNodeB simulation platform enabling verification of the basic and many advanced functionalities of the LTE (Home) eNodeB such as VoLTE, iRAT mobility, SON testing, etc.

The EPC and IMS simulation solution can be extended to test HeNB-gateways and Wi-Fi offload gateways by simulating access networks. Millions of HeNBs, Wi-Fi access points and pieces of user equipment can be simulated to perform wrap-around tests of these gateways.

Available on a portable as well as scalable ATCA platform, EXFO’s RAN testing solution meets the requirements of different customers during their early development phase as well as later stages of verification.

Equipped with an intuitive graphical interface to add, delete and modify state machines as well as information elements, it verifies the robustness of the product-under-test during extreme failure conditions. This feature also facilitates the testing of proprietary specifications.

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Figure 2: LTE Femto Gateway testing with EXFO








Figure 3: Wi-Fi Gateway testing with EXFO


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